Shunt Tester

The shunt analysis system provides an overview of all relevant shunts (like edge isolation failure, hot-spots or contact overfiring) in a solar cell within a few seconds. It is based on the change of the colour of a temperature-sensitive liquid-crystal foil at points of increased current flow. This system is an essential aid in process optimization and can also be employed for random-sample checks during production. It is a low cost/easy to operate system.

Technical Specification

• Temperature changes created by typical shunts app. 1-5 °C
• Temperature sensitivity app. 100 mK, spatial resolution 3-5 mm
• Stabilisation time: 1-2 seconds
• Up to 5 cells/minute (manual loading)