Mapcon-CPV

The IV-MAPCON system provides a solution for measurements of on-wafer produced concentrator solar cells. The system, based on a fully automated wafer probing station, can handle different wafer and cell sizes. Equipped with high concentration light sources suitable for a sun concentration ratio of 300x to 1500x, with multi-pin probe-cards and high accuracy multi-channel measurement devices, the IV-MAPCON system is able to perform full characterization maps of all relevant electrical parameters of small concentrator solar cells on wafers, with high speed and high resolution.

IV-MAPCON comes with a software systems for the analysis, visualization and storage of evaluation data in a database.

Technical Specification

• Fast wafer mapping
• Fully automated handling system
  
• Wafer sizes: 2", 4", 6", 8"
• Data analysis (binning information)
  
• Central reporting and data storage
• Networking
• Remote monitoring